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About this paper

Shiyang Hu, Lina Felsner, Andreas Maier, Veronika Ludwig, Gisela Anton, Christian Riess

A fully three-dimensional X-ray dark-field projection model is proposed and validated, enabling direct 3-D dark-field tomography with arbitrary scanning trajectories. The model demonstrates consistency with simulations and experimental measurements of anisotropic microstructures.

Key insights

  • The dark-field signal's magnitude is intricately linked to the 3-D relative orientation of the X-ray ray, the dark-field sensitivity, and the anisotropic microstructure.
  • Modeling the scatter distribution as an oblate 3-D Gaussian allows for a comprehensive representation of fiber-like microstructures, where scattering is strongest perpendicular to the fiber axis.
  • The projection model demonstrates that the anisotropic scatter component depends on the squared alignment of the fiber and sensitivity directions, naturally accounting for the π periodicity of the underlying physical scattering.

Summary by alphaXiv.

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