Reproduce “Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks” on OpenResearch

Turn your favorite coding agents into research agents that review literature, develop hypotheses, and run experiments.

Universal app for Apple silicon and Intel. Requires macOS 11 or later.

About this paper

Alessandro Greco, Vladimir Starostin, Christos Karapanagiotis, Alexander Hinderhofer, Alexander Gerlach, Linus Pithan, Sascha Liehr, Frank Schreiber and 1 more

Tip: change arxiv.org to autoarxiv.org in any arXiv abstract link to open the paper here.