Reproduce “Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans” on OpenResearch
Turn your favorite coding agents into research agents that review literature, develop hypotheses, and run experiments.
Universal app for Apple silicon and Intel. Requires macOS 11 or later.
About this paper
Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras
Tip: change arxiv.org to autoarxiv.org in any arXiv abstract link to open the paper here.