Reproduce “Automated Driver Testing for Small Footprint Embedded Systems” on OpenResearch
Turn your favorite coding agents into research agents that review literature, develop hypotheses, and run experiments.
Universal app for Apple silicon and Intel. Requires macOS 11 or later.
About this paper
Sara C. M. Souza, Rogerio Atem de Carvalho
This research introduces a low-cost, automated driver testing solution for small-footprint embedded systems, leveraging a physical "Double" device to simulate peripheral hardware interactions. The framework demonstrated its effectiveness across five communication protocols, notably uncovering underlying instabilities in the ESP32 platform's SPI and BLE driver implementations.
Key insights
- The concept of software "doubles" can be effectively extended to a physical "Double" device for realistic and cost-effective hardware simulation in embedded driver testing.
- Utilizing readily available microcontrollers like ESP32 for both DUT and "Double," coupled with interactive languages like Micropython, enables a low-cost and accessible automated testing framework.
- This non-invasive testing approach facilitates early and continuous integration of Test Driven Development (TDD) principles within the embedded systems development lifecycle.
Summary by alphaXiv.
Tip: change arxiv.org to autoarxiv.org in any arXiv abstract link to open the paper here.