Reproduce “Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review” on OpenResearch
Turn your favorite coding agents into research agents that review literature, develop hypotheses, and run experiments.
Universal app for Apple silicon and Intel. Requires macOS 11 or later.
About this paper
Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Victor Blanco, Sandip Halder, Stefan De Gendt, Wannes Meert
Tip: change arxiv.org to autoarxiv.org in any arXiv abstract link to open the paper here.